“Dr. Czitrom is a well-known statistical expert in the semiconductor industry. She has extensive practical engineering process experience in the R&D and production environments from working at Lucent, Agere and Chartered Semiconductor. She was also a statistics professor at the University of Texas. Her unique combination of academic training and industrial experience make her exceptionally effective in engaging engineering populations. Her training efficiently combines classroom teaching with one-to-one practical application with engineers. In my function of VP at Chartered Semiconductor as General Manager of a Lucent/Agere – Chartered joint venture in Singapore, and more recently, Worldwide Wafer Fabs Operations VP for International Rectifier, I contracted Dr. Czitrom to train engineering groups around the world on DOE, JMP, SPC and Data Analysis. Her assistance has been extremely well received by all engineers and technicians. They particularly appreciate the personal attention and follow-up that Dr. Czitrom provides during and after training sessions. We will continue to call on Dr. Czitrom to disseminate our SPC quality requirements to our supplier base in the US, Europe and Asia.”

Vice President
Worldwide Wafer Fab operations
International Rectifier

“Dr. Czitrom is a very knowledgeable instructor who is able to provide additional insight on topics outside the scope of the course to ensure that trainees obtain the most out of the training. She demonstrates deep knowledge of engineering statistics and analytical methods and encourages class participation. She is one of our SAS Accredited Trainers in JMP, which ensures high quality training.”

Education Manager
SAS Institute
Singapore

“Dr. Czitrom has performed Six Sigma training for the program that I direct at Chartered Semiconductor Manufacturing. We have been very pleased with her work. It has contributed to improving the company’s manufacturing efficiency by increasing yield and performance as well as by reducing costs and time to market. The courses that Veronica has taught are a critical element of the technical content of the DMAIC (Define, Measure, Analyze, Improve, Control) methodology of Six Sigma. In particular, her courses have focused on the Measure element, to ensure that gauges provide adequate measurements, on Analyze, to understand current process performance, and on Improve, to optimize process performance. Veronica’s training has been enhanced by her high-quality educational material, which includes extensive use of real semiconductor applications to make it easier for engineers to apply the methodology. Her ability to explain statistical concepts in layman’s terms has helped her convey the technical content. We are very satisfied with the Six Sigma training Veronica has delivered.”

Director Six Sigma
Chartered Semiconductor Manufacturing
Currently Programme Manager, International Rectifier

"Engineers are now using JMP for their every day activities: I noticed a mindset change approaching data and experiments in their work. This is an outstanding achievement, never seen in previous training or courses."

Site Manufacturing Engineering Manager
International Rectifier, Italy

“I have been very pleased with her work, which I feel has had a significant impact on the company. She consulted with a large number of engineers on a broad range of statistical topics, and trained hundreds of engineers and managers. She also single-handedly introduced into the company a new statistical data analysis software [JMP] that engineers use as their main off-line data analysis tool. These activities have contributed to systematic process characterization and improvement throughout the company, resulting in faster resolution of manufacturing issues and accelerated technology development. On a personal level, Veronica’s pleasant manner and subject-matter knowledge have made it easy for engineers to approach her.”

Vice President QRA
Chartered Semiconductor Manufacturing
(Currently General Manager, Freescale Semiconductor, East Kilbride)

“Her courses had waiting lists and frequently students standing at the back of the room. She was also constantly doing statistical consulting at all hours: she was seldom alone when I walked past her office. The statistical methodology she introduced was very well received by managers and engineers. The training material she developed and used includes numerous practical examples from our own industry, which highlight the relevance of the topics to the engineers and make it easier for them to apply the techniques to their own problems. Veronica also introduced a new statistical data analysis software [JMP] at Chartered. This was a major innovation, since the software’s versatility and ease of use allows engineers a much better understanding of their processes in a timely manner. The systematic statistical approach Veronica introduced is particularly critical in a high-technology industry like ours, and is an indispensable tool for Chartered to address the strong competition in the field. Veronica is a well-recognized statistician with an international reputation.”

QA Deputy Director of SMP
Chartered Semiconductor Manufacturing
(Currently Director of Quality and Product Engineering, International Rectifier)

 “Standardizing on JMP was made possible by Dr. Czitrom’s excellent semiconductor-specific training classes.  Our fab and R&D engineers around the world have now been trained.  Half of the final test engineers are trained at this point and the rewards have been enormous.  The individual coaching between half-day classes paid off for many DOE projects at many sites.  Our engineers now use the JMP Variability Plot with confidence as their favorite graph to visualize variance components.  And the simple tricks that make life easier are ingrained now, so that engineers help each other by suggesting a “Veronica Method” for speeding up work.  Engineering productivity and morale were the first benefits, and yield and reliability are now seen as slower but steady benefits.” 

Project Manager
Global Yield Management System
International Rectifier